Tag Archives: snapshot ellipsometer

Snapshot ellipsometry. Check our prototype in a video

Check out these videos showcasing our snapshot generalized ellipsometer (which measures eight elements of the normalized Mueller matrix). Additional details and explanations can be found in the video description.

Companies interested in this technology are welcome to contact me for more information, as I think this is very interesting for many applications demanding high speed.

Today I have taken these videos to demonstrate some reflection and transmission measurements.

Our current prototype works in the spectral range 400 nm – 850 nm (graphs in the computer show this spectral range).